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Monday, April 29, 2013

Failure Analysis Techniques: Resolution


STM, AFM, EELS, SIMS, TEM (Angstroms) < AES (2nm) < XPS (5nm) < SEM (10nm) < BSE/EBSD (30nm) < EDX/WDX/XRF (0.3u) < FTIR (3u)
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